Use IEEE Xplore digital library (or IEL) to get full-text access to world wide technical literature in electrical engineering, computer science, electronics, and other related disciplines. IEEE Xplore includes IEEE journals, magazines, transactions, conference proceedings, and standards. IEEE Xplore also points to content from select other publishers including the Institution of Engineering and Technology (IET), MIT Press, IBM, Alcatel-Lucent, VDE Verlag, Morgan & Claypool, Tsinghua University Press, and Beijing Institute of Aerospace Information (BIAI).
[Wright State University Libraries purchased access for you from IEEE.]
Use the SPIE Digital Library to search the full text of technical papers and conference proceedings published by the International Society for Optics and Photonics . The SPIE DL is a good place to find specialized articles on biomedical optics and imaging, defense and industrial sensing, and electronic imaging and processing. This resource has been licensed for the Wright State University Main Campus. The license excludes SPIE eBook access.
[Wright State University Libraries purchased access for you from the SPIE.]
The Web of Science Citation Index searches the literature that made the biggest research impact. Search SCI when you want to find quality over completeness. Use the Find-It button to determine Wright State University access options to the literature.
[Wright State University Libraries purchased access for you from Clarivate Analytics.]
More database resources for Electrical Engineering: